BUILT-IN-SELF-TESTING TECHNIQUES FOR PROGRAMMABLE CAPACITOR ARRAY

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" BUILT-IN-SELF-TESTING TECHNIQUES FOR PROGRAMMABLE CAPACITOR ARRAY "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	148689
Doc. No	:	ET20481
Main Entry	:	Amit Laknaur
Title Proper	:	BUILT-IN-SELF-TESTING TECHNIQUES FOR PROGRAMMABLE CAPACITOR ARRAY
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	This thesis presents ecient built-in-self-testing (BIST) techniques forprogrammable capacitor arrays (PCAs) used in field programmable analog arrays(FPAAs). The proposed BIST circuits consist of switched-capacitor (SC)integrators and analog window comparators. By taking advantage of FPAAprogrammable resources, the BIST circuits introduce very small hardwareoverhead. With considering major circuit parasitics, closed-form equations arederived to predict the outputs of PC.
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL43618.pdf
Title and statement of responsibility and	:	BUILT-IN-SELF-TESTING TECHNIQUES FOR PROGRAMMABLE CAPACITOR ARRAY [Thesis]