Quantitative Capacitance Measurements Using a Scanning Probe MicroscopeET C A L I B ~ &RIQUEMENTET C A L I B ~&RIQUEMENT.POMPES PAR TRANSITIONS MULTIPLES

منو

" Quantitative Capacitance Measurements Using a Scanning Probe MicroscopeET C A L I B ~ &RIQUEMENTET C A L I B ~&RIQUEMENT.POMPES PAR TRANSITIONS MULTIPLES "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	154726
Doc. No	:	ET26518
Main Entry	:	Michael Ott, B.A.Sc.
Title Proper	:	Quantitative Capacitance Measurements Using a Scanning Probe MicroscopeET C A L I B ~ RIQUEMENTET C A L I B ~RIQUEMENT.POMPES PAR TRANSITIONS MULTIPLES
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	This thesis describes the theory, simulation and experimental implementation of amethod by which an atomic force microscope with scanning capacitance microscopy(SCM) capability can be employed in a nontraditional fashion to quantitatively measurethe capacitance of metal-oxide-semiconductor (MOS) structures..
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL50791.pdf
Title and statement of responsibility and	:	Quantitative Capacitance Measurements Using a Scanning Probe MicroscopeET C A L I B ~ RIQUEMENTET C A L I B ~RIQUEMENT.POMPES PAR TRANSITIONS MULTIPLES [Thesis]