High-Resolut ion Time Measurement and Calibration for On-Chip Test Systems.POMPES PAR TRANSITIONS MULTIPLES

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" High-Resolut ion Time Measurement and Calibration for On-Chip Test Systems.POMPES PAR TRANSITIONS MULTIPLES "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	154120
Doc. No	:	ET25912
Main Entry	:	Peter Levine
Title Proper	:	High-Resolut ion Time Measurement and Calibration for On-Chip Test Systems.POMPES PAR TRANSITIONS MULTIPLES
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	Verification of timing performance in integrated circuits (ICs) is becoming more difficult asclock frequencies and levels of integration increase. As a result, on-chip timing measurementhas become a very attractive solution because it helps to overcome the bandwidth and testaccess limitations inherent in traditional off-chip test systems..
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL50184.pdf
Title and statement of responsibility and	:	High-Resolut ion Time Measurement and Calibration for On-Chip Test Systems.POMPES PAR TRANSITIONS MULTIPLES [Thesis]