STRESSED MEMS CPW CANTILEVERS FOR HIGH FREQUENCY SCANNING PROBE MICROSCOPY.POMPES PAR TRANSITIONS MULTIPLES

منو

" STRESSED MEMS CPW CANTILEVERS FOR HIGH FREQUENCY SCANNING PROBE MICROSCOPY.POMPES PAR TRANSITIONS MULTIPLES "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	153551
Doc. No	:	ET25343
Main Entry	:	Bingqing Liang
Title Proper	:	STRESSED MEMS CPW CANTILEVERS FOR HIGH FREQUENCY SCANNING PROBE MICROSCOPY.POMPES PAR TRANSITIONS MULTIPLES
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	This thesis presents a novel stressed MEMS coplanar waveguide (CPW) cantilever tosolve the limitations of conventional cantilevers in EFM measurements. The CPWstructure creates a matched impedance and shields the signal conductor along thecantilever to improve bandwidth, reduce electromagnetic interference effects, and enable.
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL49593.pdf
Title and statement of responsibility and	:	STRESSED MEMS CPW CANTILEVERS FOR HIGH FREQUENCY SCANNING PROBE MICROSCOPY.POMPES PAR TRANSITIONS MULTIPLES [Thesis]