CHARACTERIZATION OF INTEGRATED MOS CIRCUITS UNDER VOLTAGE STRESS AND APPLICATION TO POWER CONVERSION CHAINS OF ELECTRONIC IMPLANTS.POMPES PAR TRANSITIONS MULTIPLES

منو

" CHARACTERIZATION OF INTEGRATED MOS CIRCUITS UNDER VOLTAGE STRESS AND APPLICATION TO POWER CONVERSION CHAINS OF ELECTRONIC IMPLANTS.POMPES PAR TRANSITIONS MULTIPLES "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	153520
Doc. No	:	ET25312
Main Entry	:	Seyed Saeid HASHEMI AGHCHEH BODY
Title Proper	:	CHARACTERIZATION OF INTEGRATED MOS CIRCUITS UNDER VOLTAGE STRESS AND APPLICATION TO POWER CONVERSION CHAINS OF ELECTRONIC IMPLANTS.POMPES PAR TRANSITIONS MULTIPLES
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	New sub-micron technologies improve the performance and efficiency of the integratedcircuits. Taking advantages may bring some limitations in certain applications. For.
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL49562.pdf
Title and statement of responsibility and	:	CHARACTERIZATION OF INTEGRATED MOS CIRCUITS UNDER VOLTAGE STRESS AND APPLICATION TO POWER CONVERSION CHAINS OF ELECTRONIC IMPLANTS.POMPES PAR TRANSITIONS MULTIPLES [Thesis]