Electrostatic Force Microscopy and Atomic Force Microscopy's Applications to Integrated Circuit Internal Signal MeasurementsPOMPES PAR TRANSITIONS MULTIPLES

منو

" Electrostatic Force Microscopy and Atomic Force Microscopy's Applications to Integrated Circuit Internal Signal MeasurementsPOMPES PAR TRANSITIONS MULTIPLES "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	153254
Doc. No	:	ET25046
Main Entry	:	Richard Xuesong Qi
Title Proper	:	Electrostatic Force Microscopy and Atomic Force Microscopy's Applications to Integrated Circuit Internal Signal MeasurementsPOMPES PAR TRANSITIONS MULTIPLES
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	Measuring the signals at the internal nodes of integrated circuits is important for the de-sign verification and failure analysis of advanced microelectronics. Technological break-throughs in the evolution of the VLSI (Very Large Scale Integration) design and the mi-.
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL49260.pdf
Title and statement of responsibility and	:	Electrostatic Force Microscopy and Atomic Force Microscopy's Applications to Integrated Circuit Internal Signal MeasurementsPOMPES PAR TRANSITIONS MULTIPLES [Thesis]