Fault Tolerance and Yield Improvement of Embedded MemoriesPOMPES PAR TRANSITIONS MULTIPLES

منو

" Fault Tolerance and Yield Improvement of Embedded MemoriesPOMPES PAR TRANSITIONS MULTIPLES "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	153202
Doc. No	:	ET24994
Main Entry	:	Boris Polianskikh
Title Proper	:	Fault Tolerance and Yield Improvement of Embedded MemoriesPOMPES PAR TRANSITIONS MULTIPLES
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	Recent advances in microelectronics industry allow us to create a System-On-Chip. Theembedded memory is one of the vital parts of any system-on-chip. Today it is not enoughjust to design and fabricate the embedded memory. In order to put the System-On-Chip inmass production, the designer has to be concerned about yield and reliability.
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL49208.pdf
Title and statement of responsibility and	:	Fault Tolerance and Yield Improvement of Embedded MemoriesPOMPES PAR TRANSITIONS MULTIPLES [Thesis]