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Document Type : Latin Dissertation
Language of Document : English
Record Number : 152507
Doc. No : ET24299
Main Entry : Jing Yi Liang, B.A.Sc.
Title Proper : RESPONSE DATA COMPACTION IN BIST UNDER GENERALIZED MERGEABILITY BASED ON SWITCHING THEORY FORMULATION AND UTILIZING A NEW MEASURE OF FAILURE PROBABILITYPOMPES PAR TRANSITIONS MULTIPLES
Note : This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract : Built-in self-testing ( BIST ) is a design approach that provides the capability ofsolving many of the problems otherwise encountered in testing today's highlysophisticated digital circuits and systems. A typical BIST environment utilizes a testpattern generator that sends its outputs to a circuit under test ( CUT ) and the outputstreams from the CUT are fed into a test data andyzer. A fault is detected if the circuitresponse is different from that of the fault-free circuit. The test data analyzer is composedof a response compaction unit together with storage for the fault-free responses from theCUT and a comparator. In general, s responses corning out of the CUT are first fed into.
Subject : Electericl tess
: برق
electronic file name : TL48505.pdf
Title and statement of responsibility and : RESPONSE DATA COMPACTION IN BIST UNDER GENERALIZED MERGEABILITY BASED ON SWITCHING THEORY FORMULATION AND UTILIZING A NEW MEASURE OF FAILURE PROBABILITYPOMPES PAR TRANSITIONS MULTIPLES [Thesis]
 
 
 
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