RESPONSE DATA COMPACTION IN BIST UNDER GENERALIZED MERGEABILITY BASED ON SWITCHING THEORY FORMULATION AND UTILIZING A NEW MEASURE OF FAILURE PROBABILITYPOMPES PAR TRANSITIONS MULTIPLES

منو

" RESPONSE DATA COMPACTION IN BIST UNDER GENERALIZED MERGEABILITY BASED ON SWITCHING THEORY FORMULATION AND UTILIZING A NEW MEASURE OF FAILURE PROBABILITYPOMPES PAR TRANSITIONS MULTIPLES "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	152507
Doc. No	:	ET24299
Main Entry	:	Jing Yi Liang, B.A.Sc.
Title Proper	:	RESPONSE DATA COMPACTION IN BIST UNDER GENERALIZED MERGEABILITY BASED ON SWITCHING THEORY FORMULATION AND UTILIZING A NEW MEASURE OF FAILURE PROBABILITYPOMPES PAR TRANSITIONS MULTIPLES
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	Built-in self-testing ( BIST ) is a design approach that provides the capability ofsolving many of the problems otherwise encountered in testing today's highlysophisticated digital circuits and systems. A typical BIST environment utilizes a testpattern generator that sends its outputs to a circuit under test ( CUT ) and the outputstreams from the CUT are fed into a test data andyzer. A fault is detected if the circuitresponse is different from that of the fault-free circuit. The test data analyzer is composedof a response compaction unit together with storage for the fault-free responses from theCUT and a comparator. In general, s responses corning out of the CUT are first fed into.
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL48505.pdf
Title and statement of responsibility and	:	RESPONSE DATA COMPACTION IN BIST UNDER GENERALIZED MERGEABILITY BASED ON SWITCHING THEORY FORMULATION AND UTILIZING A NEW MEASURE OF FAILURE PROBABILITYPOMPES PAR TRANSITIONS MULTIPLES [Thesis]