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Document Type : Latin Dissertation
Language of Document : English
Record Number : 151983
Doc. No : ET23775
Main Entry : SERGIO COUTTOLENC VALD~~S
Title Proper : TESTING METHODS FOR CURRENT-MODE INTEGRATED CIRCUITS UNDER THE VERY LOW COST TESTER (V K T ) AND LABVIEW@ TEST PLATFORM
Note : This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract : Test software is widely used to perform electrical testing regardless of thehardware platform. From the entire hardware platform, the Very Low Cost Testers(VLCT) are a practical low cost options for manufacturing and education purposes,because they are custom-made. From the Software platform, LabViewض‍ (NationalInstruments Company) is presently one of most used software for testing andmeasurements in the world.In spite of the existence of test algorithms and methods which are inescapable steps ofthe electrical testing art, there is a lack of algorithms focused in testing current-modeCircuits using VLCT and LabView. Current-mode circuits are becoming the moreimportant players in the design of low power ت low voltage circuits, thereby makingnecessary to have such algorithms available..............-....,....-...,..tested for theQ1 PC1 bus cardBoth these projects mere sofixare des elopment efforts tonards contributing to dlfferentaspects of Roboucs and lZ1echatronics projects m the Controls and Roboucs Group..
Subject : Electericl tess
: برق
electronic file name : TL47034.pdf
Title and statement of responsibility and : TESTING METHODS FOR CURRENT-MODE INTEGRATED CIRCUITS UNDER THE VERY LOW COST TESTER (V K T ) AND LABVIEW@ TEST PLATFORM [Thesis]
 
 
 
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