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Document Type : Latin Dissertation
Language of Document : English
Record Number : 151851
Doc. No : ET23643
Main Entry : Lawrence John Salzano II
Title Proper : EXPERIMENTAL QUALIFICATION ASSESSMENT AND FAILURE ANALYSIS FOR REWORKED AND TRIMMED EMBEDDED RESISTOR TECHNOLOGIES
Note : This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract : Discrete passive components are continuing to increase in use in electronicsystems even though manufacturers are increasing the degree to which these systems areintegrating. Driven by performance, size and economic concerns, embedded passiveswere introduced to the market in the early 1980s. However, significant obstacles tocharacterize, evaluate and integrate embedded passives must be overcome beforewidespread adoption is realized.This thesis explores the reliability concerns and subsequent failure assessment forvariously configured, reworked and trimmed Gould subtractive nickel chromium andMacDermid additive nickel phosphorous embedded resistor technologies within a printedwiring board substrate. Environmental qualification included: thermal characterization,...........-....,....-...,..tested for theQ1 PC1 bus cardBoth these projects mere sofixare des elopment efforts tonards contributing to dlfferentaspects of Roboucs and lZ1echatronics projects m the Controls and Roboucs Group..
Subject : Electericl tess
: برق
electronic file name : TL46887.pdf
Title and statement of responsibility and : EXPERIMENTAL QUALIFICATION ASSESSMENT AND FAILURE ANALYSIS FOR REWORKED AND TRIMMED EMBEDDED RESISTOR TECHNOLOGIES [Thesis]
 
 
 
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