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Document Type : Latin Dissertation
Language of Document : English
Record Number : 151253
Doc. No : ET23045
Main Entry : Annu Radha Sharma
Title Proper : QUALITATIVE AND QUANTITATIVE STUDY OF SEM IMAGES IN TERMS OF SHARPNESS ANALYSIS
Note : This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract : Quantification of the image quality of the Scanning Electron Microscope's(SEM's) micrographs in terms of sharpness and as a function of magnification, imagesize, spot size, accelerating voltage and working distance on the Philips XL50 SEM hasbeen done. A software program called SEM MonitorMeasure, developed by theSPECTEL Corporation, has been used to obtain sharpness values for each experimentconducted for this paper. The experimental results and analytical study shows that ifmagnification, image size and spot size are adjusted to optimum values then thesharpness of low accelerating voltage images solely depends upon the change in workingdistance.-....,....-...,..tested for theQ1 PC1 bus cardBoth these projects mere sofixare des elopment efforts tonards contributing to dlfferentaspects of Roboucs and lZ1echatronics projects m the Controls and Roboucs Group..
Subject : Electericl tess
: برق
electronic file name : TL46277.pdf
Title and statement of responsibility and : QUALITATIVE AND QUANTITATIVE STUDY OF SEM IMAGES IN TERMS OF SHARPNESS ANALYSIS [Thesis]
 
 
 
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