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Document Type : Latin Dissertation
Language of Document : English
Record Number : 151235
Doc. No : ET23027
Main Entry : Danny Loren Parker
Title Proper : VERSATILE AUTOMATED SEMICONDUCTOR TESTING AND CHARACTERIZATION
Note : This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract : High-voltage SiC Schottky barrier diodes have been fabricated with 1mm squarecontacts. The SBDبs were fabricated using both an argon implant and a field plateoverlap for edge termination. The Versatile Automated Semiconductor Testing andCharacterization system was designed to fully test and characterize these devices with aslittle human interaction as possible.The focus of this thesis is to discuss the usefulness of the VASTAC system.Emphasis is placed on itبs versatility derived from a modular design allowing the systemto perform a variety of tests.Specifically, the testing and characterization of silicon carbide Schottky Barrier-....,....-...,..tested for theQ1 PC1 bus cardBoth these projects mere sofixare des elopment efforts tonards contributing to dlfferentaspects of Roboucs and lZ1echatronics projects m the Controls and Roboucs Group..
Subject : Electericl tess
: برق
electronic file name : TL46258.pdf
Title and statement of responsibility and : VERSATILE AUTOMATED SEMICONDUCTOR TESTING AND CHARACTERIZATION [Thesis]
 
 
 
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