THERMAL AND STRESS ANALYSIS OF HETEROJUNCTION BIPOLAR TRANSISTOR

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" THERMAL AND STRESS ANALYSIS OF HETEROJUNCTION BIPOLAR TRANSISTOR "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	151220
Doc. No	:	ET23012
Main Entry	:	Jose F. Rivero
Title Proper	:	THERMAL AND STRESS ANALYSIS OF HETEROJUNCTION BIPOLAR TRANSISTOR
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	The objective of this work is to perform the current induce thermalstress analysis of heterojunction bipolar transistor and to determine theimplications of the variation of the thermal shunt thickness. A thesis presentedon multi-physics using finite element analysis. covering fluid. thermal andstress with fatigue life analysis of a microelectronic heterojunction bipolartransistor.-....,....-...,..tested for theQ1 PC1 bus cardBoth these projects mere sofixare des elopment efforts tonards contributing to dlfferentaspects of Roboucs and lZ1echatronics projects m the Controls and Roboucs Group..
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL46241.pdf
Title and statement of responsibility and	:	THERMAL AND STRESS ANALYSIS OF HETEROJUNCTION BIPOLAR TRANSISTOR [Thesis]