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" EVANESCENT MICROWAVE PROBE: APPLICATIONS AND IMPLICATIONS "


Document Type : Latin Dissertation
Language of Document : English
Record Number : 150047
Doc. No : ET21839
Main Entry : Zhengyu Wang
Title Proper : EVANESCENT MICROWAVE PROBE: APPLICATIONS AND IMPLICATIONS
Note : This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract : The instrumentation and experimental techniques of scanning near-field microwavemicroscope (SNMM) have been developed rapidly in the last decade due to increasinginterest from not only academia but also semiconductor industry. The capabilities ofhigh spatial resolution imaging and material characterization at microwave frequen-cies of a SNMM grant it a unique position in the family of scanning probe microscopy.There are two components for this research. First, we used a novel near-fieldmicrowave microscope - evanescent, microwave probe (EMP), and applied it exten-sively to qualitative and quantitative material characterization applications. Second,we proposed and designed a next generation near-field microwave imager that canovercome some of the crucial shortcomings of the current setup.After giving a brief overview of near-field microwave,..tested for theQ1 PC1 bus cardBoth these projects mere sofixare des elopment efforts tonards contributing to dlfferentaspects of Roboucs and lZ1echatronics projects m the Controls and Roboucs Group..
Subject : Electericl tess
: برق
electronic file name : TL45026.pdf
Title and statement of responsibility and : EVANESCENT MICROWAVE PROBE: APPLICATIONS AND IMPLICATIONS [Thesis]
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TL45026.pdf
TL45026.pdf
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