OPTICAL CHARACTERIZATION OF FERROMAGNETIC HETEROSTRUCTURE INTERFACES AND THIN FILMS

دانشگاه آزاد اسلامی اصفهان(خوراسگان)

منو

رکورد قبلی

رکورد بعدی

" OPTICAL CHARACTERIZATION OF FERROMAGNETIC HETEROSTRUCTURE INTERFACES AND THIN FILMS "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	150021
Doc. No	:	ET21813
Main Entry	:	Haibin Zhao
Title Proper	:	OPTICAL CHARACTERIZATION OF FERROMAGNETIC HETEROSTRUCTURE INTERFACES AND THIN FILMS
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	This thesis presents optical characterizations of interfaces in ferromagneticheterostructures and thin films used for spin polarized electronic devices. In theseexperiments, femtosecond laser spectroscopies are exploited to investigate the interfacemagnetization reversal, spin precession, and band offset, which are crucial in determiningthe performances of spintronic devices.First, magnetization-induced second-harmonic-generation (MSHG) is applied tostudy interface magnetism in a hybrid structure containing a noncentrosymmetricsemiconductor - FeIAlGaAs. The reversal process of Fe interface layer magnetization iscompared with the bulk magnetization reversal. In FeIAlGaAs (OOl), the interfacemagnetization is found to be decoupled from the bulk magnetization based on thedifferent switching characteristics - single step switching occurs at the interface layer,whereas two-jump switching occurs in the bulk. In contrast, the interface layer inFe/AlGaAs (1 10) is rigidly coupled with the bulk Fe, indicating a strong impact ofelectronic structure on the magnetic interaction despite the same chemical composition.Furthermore, a time-resolved MSHG study demonstrates a coherent interfacemagnetization precession..tested for theQ1 PC1 bus cardBoth these projects mere sofixare des elopment efforts tonards contributing to dlfferentaspects of Roboucs and lZ1echatronics projects m the Controls and Roboucs Group..
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL44999.pdf
Title and statement of responsibility and	:	OPTICAL CHARACTERIZATION OF FERROMAGNETIC HETEROSTRUCTURE INTERFACES AND THIN FILMS [Thesis]