TESTING NON-CONVENTIONAL FAULTS IN NANO CMOS

منو

" TESTING NON-CONVENTIONAL FAULTS IN NANO CMOS "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	149473
Doc. No	:	ET21265
Main Entry	:	ARUN RADHAKRISHNAN, B.S.
Title Proper	:	TESTING NON-CONVENTIONAL FAULTS IN NANO CMOS
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	Rapid progress of technology towards ultra deep submicron (UDSM) nanoscale systemshas created new problems in test. While the device dimensions and supply voltage scaledown, number of transistors/die and operating frequency increases. Among several problemsthat arise in nanoscale systems, testing systems for power-supply noise and processvariation is discussed in this work..
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL44421.pdf
Title and statement of responsibility and	:	TESTING NON-CONVENTIONAL FAULTS IN NANO CMOS [Thesis]