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Document Type : Latin Dissertation
Language of Document : English
Record Number : 149336
Doc. No : ET21128
Main Entry : Wei Zou
Title Proper : DEFECT DIAGNOSIS OF VLSI CIRCUITS
Note : This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract : As manufacturers go into volume production with 90nm designs and below, thedefect diagnosis has become a challenge in the initial yield ramp. In this thesis wepropose several techniques to improve the defect diagnosis accuracy, resolution and runtime.We first introduce several techniques to enhance location based logic defectdiagnosis. The logic defect diagnosis here means the diagnosis using a gate level net listonly. In the proposed method, we first analyze the relationship of logic failure locationsand collapse multiple logic failure locations into single defects, and then use a minimumset covering algorithm to find final diagnosis candidates. In this way, we can not onlyidentify defect type but also improve diagnosis accuracy and resolution. Experimentalresults on both simulated defects and silicon defects demonstrate effectiveness of theproposed method..
Subject : Electericl tess
: برق
electronic file name : TL44276.pdf
Title and statement of responsibility and : DEFECT DIAGNOSIS OF VLSI CIRCUITS [Thesis]
 
 
 
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