AN AUTOMATIC TEST PATTERN GENERATION TECHNIQUE FOR SEQUENTIAL CIRCUITS USING SCAN APPLICATIONS

منو

" AN AUTOMATIC TEST PATTERN GENERATION TECHNIQUE FOR SEQUENTIAL CIRCUITS USING SCAN APPLICATIONS "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	149129
Doc. No	:	ET20921
Main Entry	:	Venkat N Koripalli
Title Proper	:	AN AUTOMATIC TEST PATTERN GENERATION TECHNIQUE FOR SEQUENTIAL CIRCUITS USING SCAN APPLICATIONS
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	The increase in speed and the shrinking of technology has led tomodern day ICs becoming more sensitive to timing related defects. Thesedefects must be rectified to prevent hazards in the circuit. The timingrelated defects can be identified with At-Speed Testing using the pathdelay fault model. A subset.
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL44067.pdf
Title and statement of responsibility and	:	AN AUTOMATIC TEST PATTERN GENERATION TECHNIQUE FOR SEQUENTIAL CIRCUITS USING SCAN APPLICATIONS [Thesis]