CRYOGENIC ATOMIC FORCE MICROSCOPE FOR CHARACTERIZATION OF NANOSTRUCTURES

منو

" CRYOGENIC ATOMIC FORCE MICROSCOPE FOR CHARACTERIZATION OF NANOSTRUCTURES "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	148995
Doc. No	:	ET20787
Main Entry	:	Professor Chia-Hung Yang
Title Proper	:	CRYOGENIC ATOMIC FORCE MICROSCOPE FOR CHARACTERIZATION OF NANOSTRUCTURES
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	In this thesis, we present the design and applications of a cryogenic atomicforce microscope (AFM) for characterization of nanostructures. The cryogenic AFMwith a conductive tip can measure DC current through nanostructures. We use quartztuning fork (QTF) as the force sensor. Unique coarse z motor design provides reliableautoapporach in the Z direction. AFM imaging with 10nm horizontal and ~2vertical resolution has been achieved. We have used this AFM in the current-voltagecharacterization of diodes, and, with a modified sensing mechanism, electrical forcemicroscopy (EFM) and magnetic force microscopy (MFM) have been demonstrated..
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL43932.pdf
Title and statement of responsibility and	:	CRYOGENIC ATOMIC FORCE MICROSCOPE FOR CHARACTERIZATION OF NANOSTRUCTURES [Thesis]