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Document Type : Latin Dissertation
Language of Document : English
Record Number : 148995
Doc. No : ET20787
Main Entry : Professor Chia-Hung Yang
Title Proper : CRYOGENIC ATOMIC FORCE MICROSCOPE FOR CHARACTERIZATION OF NANOSTRUCTURES
Note : This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract : In this thesis, we present the design and applications of a cryogenic atomicforce microscope (AFM) for characterization of nanostructures. The cryogenic AFMwith a conductive tip can measure DC current through nanostructures. We use quartztuning fork (QTF) as the force sensor. Unique coarse z motor design provides reliableautoapporach in the Z direction. AFM imaging with 10nm horizontal and ~2vertical resolution has been achieved. We have used this AFM in the current-voltagecharacterization of diodes, and, with a modified sensing mechanism, electrical forcemicroscopy (EFM) and magnetic force microscopy (MFM) have been demonstrated..
Subject : Electericl tess
: برق
electronic file name : TL43932.pdf
Title and statement of responsibility and : CRYOGENIC ATOMIC FORCE MICROSCOPE FOR CHARACTERIZATION OF NANOSTRUCTURES [Thesis]
 
 
 
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