CHIP DESIGN FOR LINEAR FEEDBACK SHIFT REGISTER TEST PATTERN EMBEDDING

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" CHIP DESIGN FOR LINEAR FEEDBACK SHIFT REGISTER TEST PATTERN EMBEDDING "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	148693
Doc. No	:	ET20485
Main Entry	:	Todd Dinkelman
Title Proper	:	CHIP DESIGN FOR LINEAR FEEDBACK SHIFT REGISTER TEST PATTERN EMBEDDING
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	The use of linear feedback shift registers (LFSR) for built-in self-test (BIST) invery large scale integration (VLSI) design is impacted heavily by the seed polynomial ofthe LFSR and the extra logic required to produce the desired test patterns. This workidentifies a mechanism that facilitates a search for finding an appropriate characteristicpolynomial and seed for a given set of test patterns. Resulting from this is a LFSR that.
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL43622.pdf
Title and statement of responsibility and	:	CHIP DESIGN FOR LINEAR FEEDBACK SHIFT REGISTER TEST PATTERN EMBEDDING [Thesis]