Scanning Probe Characterization of Novel Semiconductor Materials and Devices

منو

" Scanning Probe Characterization of Novel Semiconductor Materials and Devices "

Document Type	:	Latin Dissertation
Language of Document	:	English
Record Number	:	148561
Doc. No	:	ET20353
Main Entry	:	Xiaotian Zhou
Title Proper	:	Scanning Probe Characterization of Novel Semiconductor Materials and Devices
Note	:	This document is digital این مدرک بصورت الکترونیکی می باشد
Abstract	:	As semiconductor devices shrink in size, it becomes more important tocharacterize and understand electronic properties of the materials and devices at thenanoscale. Scanning probe techniques offers numerous advantages over traditional toolsused for semiconductor materials and devices characterization including high spatialresolution, ease of use and multi-functionality for electrical characterization, such ascurrent, potential and capacitance, etc..
Subject	:	Electericl tess
	:	برق
electronic file name	:	TL43480.pdf
Title and statement of responsibility and	:	Scanning Probe Characterization of Novel Semiconductor Materials and Devices [Thesis]